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MALDI-TOF MS DLS Molecular Simulation Anionic polymerization appratus TEM AFM Microtome 　  MALDI - TOF MS 　 Maker : Bruker 　 Model : Bruker REFLEX Ⅲ 　 Instrumental Specification  Linear and reflector TOF analyzer Fast dynamic range gated MCP detect system +28/-20kV HV power wupply for ion acceteration MALDI or LDI with 337nm N2-Laser CID(Dollision Induced Dissociation) HIMAS detector for synthetic polymer application 4 KHz Kigitizer MS Biotools Analysis and Interpretation Package MAP Ⅱ Sample and Liquid Handler 　                       Dynamic Light Scattering 　 Maker : Brookhaven 　 Model : Malvern 4700 series Malvern 4700 series phton correlator spectroscopy with BI9000 AT correlator 　 Instrumental Specification Evaluation of z-average translation diffusion coefficient and hydrodynamic radius of a molecule in solution. 　   Molecular Simulation   Maker : Molecular Simulation Inc. 　 Model : SGI IRIX 6.3/O2 R10000 workstation 　 Instrumental Specification Cerius2 package calculation program Simulation such as the molecular dynamic, Montecarlo method, molecular minimization and so on in various polymeric system 　      Anionic Polymerization Apparatus   The goal of polymer synthesis is to prepare a variety of polymers with control of the major variables that affect polymer properties.      Transmission Electron Microscope   Maker : HITACHI 　 Model : H - 7600 　 Instrumental Specification 　           Resolution              0.204nm (lattice image), 0.36nm (point image)            Accelerating voltage             40 to 12kV (variable in 100V/step)             Applied voltage fine adjustment function             within -2048V to 2047V in 1V/step            Spot size             HC mode : 0.8 to 10μm dia.(10 steps             HR mode : 0.6 to 7μm dia.(10 steps)            Max. tilt angle of specimen image ±20o      The Model H-7600 is transmission electron microscope applicable not only to research and development in the biotechnological field represented by medical medical science and biology, but also to study on new materials and polymer materials.   Under newly designed personal computer control, image observation conditions are graphically displayed on a window to allow their setting and change. In addition, a TV system capable of image observation in a bright room is standard-equipped, so images can be observed real time on the main screen for TEM control. Also standard-equipped is the auto focus function that enables the user to bring even a low-contrast image into focus  just by pressing a single button.      Atomic Force Microscope   Maker : Veeco Digital Ins. 　 Controllers :    The NanoScope Ⅲa controller 　 Image Modes Contact Mode TappingMode TRmode-Torsional Resonance Mode Imaging Lateral Force Microscopy (LFM) PhaseImaging Magnetic Force Microscopy (MFM) Scanning Tunneling Microscopy (SPM)       The MultiMode Scanning Probe Microscope (SPM) is the world's best-selling SPM. It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. The short mechanical path length between probe tip and sample enables very fast scan rates with utmost precision.  Microtome   Maker : Boeckeler Instruments, Inc. 　 Model : MT-X Ultramicrotome with CR-X 　 Instrumental Specification  　       High Precisions micrometer knife stage         Fine calibration 0.5 μm/increment         Coarse calibration 5 μm/increment 　       Microprocessor control         Cutting speed range 0.1 - 49.9 mm/sec         Section thickness range adjustable from 1 to 5000nm         Cutting zone 0 - 15 mm with resolution of 0.05mm 　       CR-X Cryosectioning System          Temperature range : +35℃ to -185℃          LN2 0.8 liters/hour at sectioning temperature of -90℃       The ultramicrotome is used to produce ultrathin sections for electron microscopy, as well as semi-thin and thick sections for light microscopy