Profile

Chung Ki Hong 사진
Profile.
Name Chung Ki Hong
Organization Dept of Physics
Telephone 279-2087
E-mail ckho@postech.ac.kr
Homepage http://appliedoptics.postech.ac.kr/

Education

  • 1982~1988 UNIV. OF ROCHESTER (박사-광물리(현대광학))
  • 1977~1979 한국과학기술원 (석사-물리학)
  • 1973~1977 서울대학교 (학사-물리학)

Career

  • 1989~1990 : Lawrence Livermore Lab.(물리학과)
  • 1988~1989 : Lawrence Livermore Lab.(물리학과)
  • 1979~1982 : 한국표준연구소

Profession

  • Quantum Optics
  • Electronic Speckle Pattern interferometry
  • Digital Holography
  • Optical Coherence Tomography

Journal Papers

International

  • Note: Contrast enhancement and artifact suppression in computed tomography using sinogram normalization, REVIEW OF SCIENTIFIC INSTRUMENTS, , 89, 16101-1-16101-3 (2018)
  • A method of hard X-ray phase-shifting digital holography, JOURNAL OF SYNCHROTRON RADIATION, , 23, 1024-1029 (2016)
  • Runout error correction in tomographic reconstruction by intensity summation method, JOURNAL OF SYNCHROTRON RADIATION, , 23, 1237-1240 (2016)
  • Measurement of coherence length and incoherent source size of hard x-ray undulator beamline at Pohang Light Source-II, REVIEW OF SCIENTIFIC INSTRUMENTS, , 85, - (2014)
  • High-Resolution Soft X-ray Digital In-Line Holographic Microscopy, JAPANESE JOURNAL OF APPLIED PHYSICS, , 50, - (2011)
  • A compact, sample-in-atmospheric-pressure soft x-ray microscope developed at Pohang Light Source, REVIEW OF SCIENTIFIC INSTRUMENTS, , 81, - (2010)
  • Optical section imaging of the tilted planes by illumination-angle-scanning digital interference holography, APPLIED OPTICS, , 49, 5110-5116 (2010)
  • Efficient alignment scheme for zone-plates-based transmission soft X-ray microscope, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, , 624, 242-245 (2010)
  • Rotation error correction by numerical focus adjustment in tomographic phase microscopy, OPTICAL ENGINEERING, , 48, 105801-105801 (2009)
  • Pixel-size-maintained image reconstruction of digital holograms on arbitrarily tilted planes by the angular spectrum method, APPLIED OPTICS, , 47, 3064-3071 (2008)
  • Illumination-angle-scanning digital interference holography for optical section imaging, OPTICS LETTERS, , 33, 2392-2394 (2008)
  • Resolution of Closely-Positioned Optical Vortices by Phase-Shifting Interferometry, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, , 53, 3827-3831 (2008)
  • Phase-contrast microscopy by in-line phase-shifting digital holography: shape measurement of a titanium pattern with nanometer axial resolution, OPTICAL ENGINEERING, , 46, - (2007)
  • Interframe intensity correlation matrix for self-calibration in phase-shifting interferometry, APPLIED OPTICS, , 44, 4860-4869 (2005)
  • X-ray absorption spectroscopy in total electron yield mode of scanning photoelectron microscopy, JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, , 148, 137-141 (2005)
  • 3-dimensional micro-structure inspection by phase-shifting digital holography, KEY ENGINEERING MATERIALS, , 270-2, 756-761 (2004)
  • Least-squares phase estimation with multiple parameters in phase-shifting electronic speckle pattern interferometry, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, , 20, 240-247 (2003)
  • Photoelectron energy shift induced by microfocused x rays in micrometer-thick insulating layers, JOURNAL OF APPLIED PHYSICS, , 93, 8982-8986 (2003)
  • A scanning photoelectron microscope for materials science spectromicroscopy at the Pohang Light Source, JOURNAL DE PHYSIQUE IV, , 104, 67-70 (2003)
  • Effect of focused X-rays on micrometer-thick insulating layers in scanning photoelectron microscopy, JOURNAL DE PHYSIQUE IV, , 104, 463-466 (2003)
  • Photoluminescence degradation in porous silicon upon annealing at high temperature in vacuum, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, , 42, 808-813 (2003)
  • The effects of annealing of a p-type photoluminescent porous silicon in vacuum, SURFACE REVIEW AND LETTERS, , 9, 261-265 (2002)
  • The application of scanning photoelectron microscopy of the PLS (Pohang light source) to investigation of semiconductor devices, SURFACE REVIEW AND LETTERS, , 9, 497-501 (2002)
  • Generation of correlated photons via four-wave mixing in optical fibres, JOURNAL OF OPTICS B-QUANTUM AND SEMICLASSICAL OPTICS, , 3, 346-352 (2001)
  • Effect of the detector efficiency on the phase sensitivity in a Mach-Zehnder interferometer, PHYSICAL REVIEW A, , 60, 708-711 (1999)
  • Two-photon double-slit interference experiment, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, , 15, 1192-1197 (1998)
  • In-plane strains measurement by using the electronic speckle pattern interferometry, KSME INTERNATIONAL JOURNAL, , 12, 215-222 (1998)
  • Interaction-free measurement based on nonclassical fourth-order interference, QUANTUM AND SEMICLASSICAL OPTICS, , 10, 637-641 (1998)
  • Manifestation of complementarity in double-slit interference, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, , 33, 383-387 (1998)
  • The phase-sensitivity of a Mach-Zehnder interferometer for the Fock state inputs, OPTICS COMMUNICATIONS, , 156, 37-42 (1998)
  • Maximum-likelihood phase estimation in phase-shifting electronic speckle pattern interferometry and its comparison with least-squares estimation, JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, , 14, 1051-1057 (1997)
  • On the microstructure and optical properties of Ba0.5Sr0.5TiO3 films, THIN SOLID FILMS, , 299, 14-17 (1997)
  • On the microstructure and optical properties of Ba0.5Sr0.5TiO3 films, THIN SOLID FILMS, , 305, 30-34 (1997)
  • LEAST-SQUARES FITTING OF THE PHASE MAP OBTAINED IN PHASE-SHIFTING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY, OPTICS LETTERS, , 20, 931-933 (1995)

Domestic Journal Papers

  • 광감도 비교를 통한 면외 변형 측정 조건에 대한 연구, 한국정밀공학회지, , 32, 807-813 (2015)
  • 간섭거리가 짧은 광원을 이용한 위상이동 디지털 홀로그래피의 구현, 한국정밀공학회지, , 24, 7-15 (2007)
  • 위상이동 간섭계를 이용한 SI3N4 박막의 두께 분포 측정, 비파괴검사 학회지, , 25, 67-73 (2005)
  • ESPI와 FEM에 의한 얇은 알루미늄판의 진동 모드 비교, 대한기계학회논문집 A, , 22, 1813-1820 (1998)
  • 두 광자 간섭실험에서 "양자지우개" 효과, 새물리, , 35, 322-328 (1995)
  • 광자쌍의 비국소적 상관관계와 빛의 진공상태, 한국광학회지, , 5, 173-181 (1994)
  • 광자쌍을 이용한 광검출기의 양자효율 절대측정, 한국광학회지, , 4, 452-456 (1993)
  • 매개하향변환과정에서 발생되는 광자쌍의 4차간섭현상, 새물리, , 33, 37-42 (1993)

General Journal Papers

  • Three Dimensional Shape Measurement of a Micro Fresnel Lens with In-line Phase-shifting Digital Holographic Microscopy, JOURNAL OF OPTICAL SOCIETY OF KOREA, , 10, 178-183 (2006)

Conference Proceedings

Invited Talk or Presentations

  • Precise phase-contrast image using in-line phase-shifting, OSA annual meeting, 0, 0, - (0000)

Books

Research Activities

  • 과학고 창의적 사사연구과제 지원사업 (소규모 신기루 현상에 관한 연구), 한양대학교 (2003-2004)
  • 정현진동 측정용 위상 동기 SOFTWARE개발, 한양대학교 (2001-2002)
  • DEVELOPMENT OF COHERENT X-RAY APPLICATION T, 포항공과대학교 (2001-2002)
  • S_직접비_홍정기, 포항공과대학교 (2006-2019)
  • 인건비풀링과제, 포항공과대학교 (2006-2015)
  • 자체연구개발과제, 포항공과대학교 (2006-2016)
  • DEVELOPMENT OF DIGITAL OPTICAL CONVERGENCE TECHNIQUE FOR PRECISION DIAGNOSIS OF HIDDEN DAMAGE OF ADVANCED COMPONENTS AND MATERIALS, 한양대학교 산학협력단 (2013-2014)
  • DEVELOPMENT OF DIGITAL OPTICAL CONVERGENCE TECHNIQUE FOR PRECISION DIAGNOSIS OF HIDDEN DAMAGE OF ADVANCED COMPONENTS AND MATERIALS, 한양대학교 산학협력단 (2014-2015)
  • 학생인건비통합관리과제, 포항공대산학협력단 (2014-2020)
  • 4.10068 이월과제, 한양대학교 산학협력단 (2014-2015)
  • 자체연구개발과제[2015년 신설], 포항공과대학교 (2015-2019)
  • DEVELOPMENT OF DIGITAL OPTICAL CONVERGENCE TECHNIQUE FOR PRECISION DIAGNOSIS OF HIDDEN DAMAGE OF ADVANCED COMPONENTS AND MATERIALS, 한양대학교 (2015-2016)
  • DEVELOPMENT OF DIGITAL OPTICAL CONVERGENCE TECHNIQUE FOR PRECISION DIAGNOSIS OF HIDDEN DAMAGE OF ADVANCED COMPONENTS AND MATERIALS, 한양대학교 (2016-2017)
  • 4.12695_이월과제, 한양대학교 (2016-2017)
  • DEVELOPMENT OF DIGITAL OPTICAL CONVERGENCE TECHNIQUE FOR PRECISION DIAGNOSIS OF HIDDEN DAMAGE OF ADVANCED COMPONENTS AND MATERIALS, 한양대학교 (2017-2018)
  • 4.13975/4.14992_이월과제, 한양대학교 (2017-2018)
  • DEVELOPMENT OF DIGITAL OPTICAL CONVERGENCE TECHNIQUE FOR PRECISION DIAGNOSIS OF HIDDEN DAMAGE OF ADVANCED COMPONENTS AND MATERIALS, 한양대학교 (2018-2019)

IP

  • 홍정기,홍기상,김동걸, 외관 굴곡 측정 시스템 및 측정방법, 한국, 10-2000-0085040 (1992)