This system is used to measure the field emission current in diamond and field emitters made of various materials (Si, Metal tip). When high voltage is applied in metal or semiconductor in vacuum condition, the electrons could emit beyond their potential barrier through quantum mechanical tunneling. The field emission property has many applications such as field emission display and electron sources. This system in our laboratory is designed to evaluate the field emission capability of each material, simultaneously. Field emission current was measure through GPIB control system and it was evacuated using turbo molecular pump. The manipulator was equipped to probe the sample in vacuum. Keithley- 487 and K-238 current measurement systems could sweep the voltage up to 5 kV and measure the current up to 2.5 mA.