Queueing/Communications | Reliability/Quality | Chemometrics/Prediction/Datamining | Scheduling/Others
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International
Journals |
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Balamurali, S., M. Aslam
and Chi-Hyuck Jun, “Bayesian double sampling plan
under Gamma-Poisson distribution”, Research
Journal of Applied Sciences, Engineering and Technology, 4(8), 949-956,
April 2012. |
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Wu,
C.-W., M. Aslam and Chi-Hyuck
Jun, “Variables sampling inspection scheme for resubmitted lots based on the process
capability index Cpk”, European Journal of Operational Research, 217(3), 560-566, March
2012. |
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Lee,
Sang-Ho, M. Aslam, and Chi-Hyuck
Jun, “Repetitive Group Sampling Plans with Double Specification Limits”, Pakistan Journal of Statistics, 28(1),
41-57, Jan. 2012 |
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Aslam, M., S. Balamurali, C.-H.
Jun, M. Ahmad and M. Rasool, “An optimal design of a
skip lot sampling plan of type V by minimizing average sample number”, Pakistan Journal of Statistics, 28(1),
131-140, Jan. 2012. |
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Aslam, M., Chi-Hyuck Jun and M.
Ahmad, “A two-stage group sampling plan based on truncated life tests for a
general distribution”, Journal of
Statistical Computation and Simulation, 81(12), 1927-1938, December 2011. |
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Aslam, M., Chi-Hyuck Jun, Y.L. Lio, M. Ahmad, and M. Rasool,
“Group Acceptance Sampling Plans for Resubmitted Lots under Burr-type XII
Distributions”, Journal of the Chinese
Institute of Industrial Engineers, 28(8), 606-615, December 2011. |
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Aslam, M. Ching-Ho Yen and Chi-Hyuck Jun,
“Variable repetitive group sampling plans with process loss consideration”, Journal of Statistical Computation and
Simulation, 81(11), 1417-1432, November 2011. |
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Aslam, M., M. Shoaib, Chi-Hyuck Jun and N. Saeed, “Time
truncated group acceptance sampling plans for lifetime percentiles under
generalized log-logistic distributions”, International
Journal of Current Research and Review, 3(11), 23-35, November 2011 |
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Aslam, M., C.-H. Jun, Y.L. Lio,
and M. Ahmad, “Group acceptance sampling plans for the generalized Rayleigh
distribution”, International Journal of
Intelligent Technologies & Applied Statistics, 4(3), 355-365, September
2011. |
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Aslam M., D. Kundu, Chi-Hyuck Jun, M. Ahmad, “Time Truncated Group Acceptance
Sampling Plans for Generalized Exponential Distribution”, Journal of Testing and Evaluation,
39(4), 671-677, July 2011. |
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Balamurali, S. and Chi-Hyuck
Jun, ”A New System of Skip-lot Sampling Plans Having
a Provision for Reducing Normal Inspection”, Applied Stochastic Models in Business and Industry, 27(3),
348-363, June 2011. |
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Fernandez,
A. J., C. J. Perez-Gonzalez, M. Aslam and Chi-Hyuck Jun, “Design of progressively censored group
sampling plans for Weibull distributions: An
optimization problem”, European Journal
of Operational Research, 211(3), 525-532, June 2011. |
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Aslam, M., Shoaib, M., Lio, Y., Jun,
C.-H., “Improved Group Acceptance Sampling Plan for Marshall-Olkin Extended Lomax Distribution Percentiles”, International Journal of Current Research
and Review, 3(6), 10-25. June 2011. |
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Aslam, M., S.-R. Huang, Chi-Hyuck
Jun, M. Ahmad and M. Rasool, “A reliability
sampling plan based on progressive interval censoring under Pareto
distribution of second kind”, Industrial
Engineering & Management Systems, 10(2), 154-160, June 2011. |
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Aslam,
M, Chi-Hyuck Jun, and M. Ahmad, “New acceptance
sampling plans based on life tests for Birnbaum–Saunders
distributions”, Journal of Statistical
Computation and Simulation, 81(4), 461-470, April 2011. |
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Aslam, M., Chi-Hyuck Jun, Hyeseon Lee, M. Ahmad and M. Rasool,
“Improved group sampling plans based on time-truncated life tests”, Chilean Journal of Statistics, 2(1),
85-97, April 2011. |
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Aslam, M., S. Balamurali, Chi-Hyuck Jun and M. Ahmad, “Optimal designing of a skip lot
sampling plan by two point method”, Pakistan
Journal of Statistics, 26(4), 585-592, Oct. 2010. |
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Lee,
Sang-Ho and Chi-Hyuck Jun, “A new control scheme always
better than X-bar chart”, Communications
in Statistics – Theory and Methods, 39(19), 3492-3503, Sept 2010. |
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Aslam, M., Chi-Hyuck Jun and M.
Ahmad, “Design of a time-truncated double sampling plan for a general
distribution” Journal of Applied
Statistics, 37(8), 1369-1379, Aug 2010. |
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Aslam, M., S. Balamurali, Chi-Hyuck Jun and M. Ahmad, “A new variables sampling plan
for life testing in a continuous process under Weibull
distribution”, Pakistan Journal of
Statistics, 26(3), 539-546, July 2010. |
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Aslam, M., Chi-Hyuck Jun and M.
Ahmad, “A double sampling plan for a reliability demonstration test”, Journal of Statistical Theory and
Applications, 9(2), 295-309, June 2010. |
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Jun,
Chi-Hyuck, |
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Aslam, M. and Chi-Hyuck Jun, “A
Double Acceptance Sampling Plan for Generalized Log-Logistic Distributions
with Known Shape Parameters”, Journal
of Applied Statistics, 37(3-4), 405 – 414, March-April 2010. |
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Aslam, M., |
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Balamurali, S. and Chi-Hyuck
Jun, "Designing of variables two plan system by minimizing the average
sample number", Journal Applied
Statistics, 36(10), 1159-1172, Oct. 2009. |
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Aslam, M. and Chi-Hyuck Jun, “A
Group Acceptance Sampling Plan for Truncated Life Test Having Weibull Distribution”, Journal of Applied Statistics, 36(9), 1021-1027, September 2009. |
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Aslam, M., Chi-Hyuck Jun and M. Ahmad , “A Group Sampling Plan based on Truncated Life
Test for Gamma Distributed Items" , Pakistan
Journal of Statistics, 25(3), 333-340, July 2009. |
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Aslam, M., Chi-Hyuck Jun and M.
Ahmad, “A Double Acceptance Sampling Plan Based on Truncated Life Tests in
the Weibull Model”, Journal of Statistical Theory and Applications, 8(2), 191-206,
June 2009. |
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Aslam, M. and Chi-Hyuck Jun,
“Group Acceptance Sampling Plans for Truncated Life Tests based on the
Inverse Rayleigh and Log-logistic Distributions”, Pakistan Journal of Statistics,
25(2), 107-119, April 2009. |
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Balamurali, S., Chi-Hyuck
Jun and Il-gyo Chong, "A New Hybrid
Reliability Sampling System for Exponential Lifetime Distributions", Journal of Applied Statistical Science,
16(3), September 2007, 365-376. |
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Balamurali, S. and Chi-Hyuck Jun, “Multiple
Dependent State Sampling Plans for Lot Acceptance Based on Measurement Data”,
European Journal of Operational
Research, 180, 1221-1230, Aug. 2007. |
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Jun, Chi-Hyuck,
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Jun, Chi-Hyuck,
S. Balamurali, and Sang-Ho Lee, "Variables
sampling plans for Weibull distributed lifetimes under sudden death testing”,
IEEE Transactions on Reliability,
55(1), 53-58, March 2006. |
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Balamurali, S. and Chi-Hyuck
Jun, “Repetitive group sampling procedure for variables inspection”, Journal of Applied Statistics, 33(3),
327-338, April 2006. |
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Balamurali, S. and Chi-Hyuck Jun, “Average
Outgoing Quality of CSP-C Continuous Sampling Plan under Short Run Production
Processes”, Journal of Applied
Statistics, 33(2), 139-154, Mar. 2006. |
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Balamurali, S., H. Park, C.-H. Jun, K.-J. Kim,
and J. Lee, "Designing
of variables repetitive group sampling plan involving minimum average sample
number", Communications in
Statistics - Simulation and Computation, 34 (3), Oct. 2005, 799-809. |
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Ko, Young-Hyun, Kwang-Jae Kim
and Chi-Hyuck Jun, “A
new loss function-based method for multiresponse optimization”, Journal of Quality Technology, 37(1),
50-59, Jan. 2005. |
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Balamurali, S., M. Kalyanasundaram
and Chi-Hyuck Jun, “Generalized
CSP-(C1, C2) sampling plan for continuous production processes”, International Journal of Reliability,
Quality and Safety Engineering, 12(2), 75-93, April 2005. |
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Balamurali, S. and Chi-Hyuck
Jun, “Modified
CSP-T Sampling Procedures for Continuous Production Processes”, Quality Technology & Quantitative
Management, 1(2), 175-188, Sep. 2004. |
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Park, Kwang-Su and Chi-Hyuck Jun , “Semiconductor yield models using contagious distributions and their limiting forms”, Computers & Industrial Engineering, Vol. 42 (2-4) pp. 115-125, April 2002. |
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Park, Kwang-su and Chi-Hyuck Jun, “A Bayesian Approach to the Optimal Policy
under Imperfect Preventive Maintenance Models”, Chapter 8, in RECENT
ADVANCES IN RELIABILITY AND QUALITY ENGINEERING (editor: Hoang Pham), World |
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Yeo, Kunmin
and Chi-Hyuck Jun, "Analysis of System Lifetime
Subject to Two Classes of Random Shocks", International Journal of Reliability and Application, 1, 1,
49-64, 2000 |
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Park, Kwang-su
and Jun, Chi-Hyuck, "Use of
Contagious Distribution in the Semiconductor for Yield Models considering
Cluster Effect", Communications
in Statistics: Theory and Methods 29.1,1~17, 2000 |
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Jun, Chi-Hyuck, Soo Y. Chang, Yushin Hong, and Heejoong Yang, "A Bayesian Approach to Prediction of System Failure Rates by Criticalities Under Event Trees", International Journal of Production Economics, 60-61, 623-628, 1999 |
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Jun, Chi-Hyuck, Yushin Hong, Soo Young Kim, Kwang-Su Park and Hangyeob Park, "A Simulation-based Semiconductor Chip Yield Model Incorporating a New Defect Cluster Index", Microelectronics Reliability, 39, 451-456, 1999 |
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Jun, Chi-Hyuck and Suk Hwan Suh, "Statistical Tool Breakage Detection Schemes Based on Vibration Signals in NC Milling", International Journal of Machine Tools & Manufacture, 39, 1733-1746, 1999. |
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Suh, Jae-Joon, Han, Chi-Moon and Jun, Chi-Hyuck, "System Reliability Estimation Using Simulation Combined with Network Reductions", Microelectronics & Reliability, 36, 9, 1263-1267, 1996 |
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Choi, Moon Soo and Jun, Chi-Hyuck, "Some Variants of Polygon-to-Chain Reductions in Evaluating Reliability of Undirected Network", Microelectronics and Reliability, 35, 1, 1-11, 1995 |
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Choi Moon Soo and Jun, Chi-Hyuck, "Terminal-Pair Reliability of Network System Using Flow Augmenting Path Search Algorithm", Microelectronics and Reliability, 34, 6, 999-1012, 1994. |
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Jun, Chi-Hyuck and Choi Moon Soo, "Average Run Lengths of a Control Chart Based on the Sum of Squared Errors", Computers & Industrial Engineering, 27, 349-352, 1994. |
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Jun, Chi-Hyuck and Choi Moon Soo, "Simulating the Average Run Length for CUSUM Schemes Using Variance Reduction Techniques", Communications to Statistics - Simulation and Computation, 22, 877-887, 1993. |
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Jun, Chi-Hyuck and S.M. Ross, "System Reliability by Simulation: Random Hazards Versus Importance Sampling", Probability in Engineering and Informational Sciences, 6, 119-126, 1992. |
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Domestic
Journals |
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(Estimation
of a structural equation model including brand choice probabilities) |
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Aslam, M., M.K. Pervaiz and C.-H.
Jun, “An improved group sampling plan based on time-truncated life tests”, Communications of the Korean Statistical
Society, 17(3), 319-326, May 2010. |
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Aslam, M., Chi-Hyuck Jun, M. Rasool and M. Ahmad, “A Time Truncated Two-Stage Group
Sampling Plan for Weibull Distribution”, Communications of the Korean Statistical
Society, 17(1), 89-98, Jan. 2010. |
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박항엽, |
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Aslam, M., M. Azam, C.-H. Jun and
M. Ahmad, “Economic design of time truncated sampling plans for Weibull distribution using percentiles as quality parameter”,
Proceedings of 11th Islamic Countries Conference on Statistical
Sciences, Dec. 19-22, 2011, Univ of Management and
Technology, Lahore, Pakistan, 293-305. |
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Aslam, M., Jun, C.-H., Shoaib, M.
and Rasool, M., “A Two-Stage Group Acceptance
Sampling Plan based on Truncated Life Tests for the Weibull
distribution (single 0, 1)”, Proceedings of 3rd International Conference on
Statistical Sciences, November 25-27, 2010, University of Punjab Lahore,
Pakistan, 52-54. |
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Lee,
Sang-Ho, Chi-Hyuck Jun, Juncheul
Jung, Tae-Soo Kim and Ji-Hoon
Lee, “Identifying sources of dimensional variation affecting assembly quality
of automobiles”, Proceedings of the 9th APIEMS Conference, Nusa Dua, Bali, Indonesia, December 3-5, 2008, 753-759. |
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Lee,
Sang-Ho, E.-G. Kim, H.-M. You and Chi-Hyuck Jun, “A
new multivariate control scheme using p-values”, INFORMS 2007, Nov 4-7, 2007,
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Jun,
Chi-Hyuck and S. Balamurali,
“Failure-censored variables sampling plans for Weibull
distribution with known shape parameter”, Proceedings of 2005 International
Conference of KIPE, |
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Park,
Kwang-Su and Chi-Hyuck
Jun, "A Class of Contagious Distributions and Semiconductor Yield Models
", Proceedings of the 26th International Conference on Computers & Industrial
Engineering, (Ed. By |
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Park, Kwang-Su, Chi-Hyuck Jun, "Semiconductor Yield Models Considering Cluster Effect and Fault Observation", Int’l Conf on Semiconductor Manufacturing Operational Modeling & Simulation (SMOMS’99) , 107-112, San Francisco, USA, 19990117 |
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Jun,
Chi-Hyuck and |
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Park,
Kwang-Su and Chi-Hyuck
Jun, "A Bayesian Approach to a Periodic Incomplete Preventive
Maintenance Model", Proceedings of the fourth ISSAT International
Conference on Reliability and Quality in Design, 184-188, Seattle, USA,
August 12-14, 1998 |
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Jun, Chi-Hyuck, Soo Y. Chang, Yushin Hong and Heejoong Yang, "A Bayesian Approach to Prediction of System Failure Rates by Criticalities under Event Trees", Proceedings of the 14th International Conference on Production Research, Osaka, Japan, August 4-8, 1997, 710-713. |
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Jun, Chi-Hyuck, Yushin Hong, Soo Young Kim, Kwang-Su Park and Hangyeob Park, "A New Cluster Index for Semiconductor Wafer Defects and Simulation-based Yield Prediction Models", Proceedings of the 22nd ICC&IE, Dec.20-22, 1997, Cairo, Egypt, pp.619-622. |
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Jun,
Chi-Hyuck, Soo Y. Chang, Yushin Hong and Heejoong Yang,
"Mission Reliability Prediction Using Event
Trees and Bayesian Approach", Proceedings of the second
ISSAT International Conference on Reliability & Quality Design (Editor:
H. Pham), |
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Jun, Chi-Hyuck, Suk-Hwan Suh and Yong-Jong Choi, "Statistical Tool Breakage Detection Schemes in NC Milling ", Proceedings of CARS & FOF ‘95, The Universidad Tecnologica de Pereira, Colombia, August 28-30, 1995, 663-668. |
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Jun,
Chi-Hyuck and Moon Soo Choi, "Average Run Lengths of a Control Chart Based
on the Sum of Squared Errors", Proceedings of 16th International
Conference on Computers & Industrial Engineering, |
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Jun,
Chi-Hyuck, M.S. Choi and Hyeran Lim, "Process Monitoring Through Control
Charts", International Symposium on Intelligent Process Automation, |
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이상호, 전치혁, “Statistical process monitoring scheme
controlling false discovery rate”, 2011년 대한설비관리학회
제16회 학술발표대회논문집, 2011.10.27-28, 강원도
용평리조트, 199-208. |
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황욱연, 신주환, |
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주민보, 황욱연, |
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Balamurali, S., R. Göb
and Chi-Hyuck Jun, “Attributes sampling schemes in
international standards”, Encyclopedia
of Statistics in Quality and Reliability (eds,
F. Ruggeri et al.), Wiley, 2008. |
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Balamurali, S., R. Göb
and Chi-Hyuck Jun, “Variables sampling schemes in
international standards”, Encyclopedia
of Statistics in Quality and Reliability (eds,
F. Ruggeri et al.), Wiley, 2008. |
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Balamurali, S., Chi-Hyuck
Jun and E. von Collani, “Skip lot and chain
sampling”, Encyclopedia of Statistics
in Quality and Reliability (eds, F. Ruggeri et
al.), Wiley, 2008. |
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